Soft X-ray, Far UV Photodiodes

Our R&D 100 award-winning X-UV detector series are a unique class of silicon photodiodes designed for additional sensitivity in the X-Ray region of the electromagnetic spectrum without the need of scintillator crystals or screens. They are sensitive over a wide spectral range from 0.07nm to 200nm (6eV to 17.6KeV), where one electron-hole pair is created per 3.63eV of incident energy which corresponds to extremely high stable quantum efficiencies. Applying a reverse bias reduces the capacitance and increases the speed of response. When unbiased, these detectors are suitable for low noise and low drift applications. They are also excellent choices for detecting light wavelengths between 350 to 1100nm. For measurement of radiation energies above 17.6 keV, refer to our Fully Depleted Radiation Detectors series.

Image Datasheet Model Number Active Area Active Area Dimensions Shunt Resistance Capacitance Package View
PDF XUV-005 5 mm² 2.57 Φ mm 2000 MΩ 0.3 nF TO-5 View
PDF XUV-020 20 mm² 5.00 Φ mm 500 MΩ 1.2 nF TO-8 View
PDF XUV-035 35 mm² 6.78 x 5.59 mm 300 MΩ 2 nF TO-8 View
PDF XUV-100 100 mm² 11.33 Φ mm 100 MΩ 6 nF BNC View
PDF XUV-50C 50 mm² 8.02 Φ mm 200 MΩ 2 nF Ceramic View
PDF XUV-100C 100 mm² 10 x 10 mm 100 MΩ 6 nF Ceramic View

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